JFK Debutes New Technology
One of the worst parts about flying is going through airport security. Between the impatient passengers tired of waiting in line and the often short tempered TSA agents, going through the process can be needlessly stressful. That being said, the most important aspect of air travel is safety. Without security we would all be at risk, so like it or not, we all have to do it.
Since 2006, airport security has been even stricter after three British men attempted to bring aboard liquid explosives on a plane. New York’s John F. Kennedy International Airport debuted new 3D scanners that are more effective at detecting dangerous items. Known as the 3-F scanner, they use CT scan technology to create high-resolution images of the contents of bags. This means that in the near future, passengers may not have to take laptops or large tech items out of their bags when putting their luggage through security. No one likes pulling things out of their carry-on, filling multiple bins, and having to juggle all of their stuff while trying to go through security, so this would certainly make life easier.
The added safety of knowing that any dangerous items could be more easily detected by security helps give everybody peace of mind and overall reduce the stress of travel. Hopefully this new technology is successful and will catch on elsewhere, and we will all be able to travel more safely and with greater ease.